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Course Title: |
MATERIAL CHARACTERIZATION TECHNIQUES |
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Course Code: |
FZK2416 |
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Type of Course: |
Optional |
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Level of Course: |
First Cycle |
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Year of Study: |
2 |
6 |
Semester: |
4 |
7 |
ECTS Credits Allocated: |
6 |
8 |
Theoretical (hour/week): |
3 |
9 |
Practice (hour/week) : |
0 |
10 |
Laboratory (hour/week) : |
0 |
11 |
Prerequisites: |
It is necessary to know the materials physics. |
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Recommended optional programme components: |
None |
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Language: |
Turkish |
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Mode of Delivery: |
Face to face |
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Course Coordinator: |
Doç. Dr. MÜRŞİDE ŞAFAK HACIİSMAİLOĞLU |
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Course Lecturers: |
Prof. Dr. Mürsel ALPER |
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Contactinformation of the Course Coordinator: |
Doç. Dr. Mürşide HACIİSMAİLOĞLU, msafak@uludag.edu.tr, 02242941697 Uludağ Üniversitesi, Fen Edebiyat Fakültesi, Fizik Bölümü, 16059, Görükle, BURSA |
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Website: |
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Objective of the Course: |
To learn the properties of the materials and their characterization techniques
To examine the relationships between the properties of the materials
To have an idea about the fabrication of new types of materials and their characterization techniques. |
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Contribution of the Course to Professional Development |
1. Learns and recognizes types and properties of materials.
2. Learns the techniques used to determine the properties of materials.
3. Learns and knows which property of the material should be measured with which technique.
4. Learns to establish relationships between material properties and interpret the properties.
5. Learns in which application area the materials will be used. |
Week |
Theoretical |
Practical |
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Material Fabrication Methods (vacuum techniques MBE-sputtering-thermal evaporation, atomic layer deposition, laser ablation) |
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Material Fabrication Methods (non-vacuum techniques, electrochemical techniques) |
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Material Types and Interaction of Electromagnetic Wave with Matter |
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Structural Characterization - X-ray diffraction (XRD) technique |
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Structural Characterization - Microscopy Techniques (electron microscopes: TEM, SEM, STEM, scanning electron microscope (SEM), transmission electron microscope (TEM)) |
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Structural Characterization - Microscopy Techniques (atomic force microscope AFM, Magnetic force microscope -MFM) |
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7 |
Structural Characterization - Fourier Transform Infrared Spectroscopy (FTIR), Raman spectroscopy |
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Elemental Analysis-Energy dispersive X-ray spectroscopy (EDX), Wavelength dispersive X-ray spectroscopy (WDX), X-ray photoelectron spectroscopy (XPS) |
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Optical Characterization- Optical Microscope, UV-vis spectrometer |
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Mechanical Characterization - measurement of viscosity, elastic-plastic properties |
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Thermal Characterization-differential thermal analysis, thermogravimetric analysis |
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Electrical and Electronic Characterization-Conductivity measurement, Hall effect measurement, C-V; I-V measurements |
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Magnetic Characterization–Measurement of magnetic properties (VSM, MOKE, etc.) |
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Magnetotransport Characterization – Magnetoresistance measurements |
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